• DocumentCode
    1756675
  • Title

    Full-Gate Verification of Superconducting Integrated Circuit Layouts With InductEx

  • Author

    Fourie, Coenrad J.

  • Author_Institution
    Stellenbosch Univ., Stellenbosch, South Africa
  • Volume
    25
  • Issue
    1
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    At present, superconducting integrated circuit layouts are verified through a variety of techniques. A layout-versus-schematic method implemented in Cadence allows extraction of circuit schematics with certain geometry-dependent parameters. Lmeter calculates inductance in a layout network and, with proper setup, may also calculate resistance separately. Recently, InductEx was introduced to calculate multiterminal network inductance in a superconductor structure with support for more complicated 3-D geometries. Here, we present an improvement to InductEx that allows resistance, inductance, and Josephson junction critical current extraction of a full superconducting digital logic gate or cell in a single execution, as well as in reasonable time. We show how InductEx was designed to operate on tape-out ready layouts and, through example, how it is used for full-gate layout verification of contemporary logic cells.
  • Keywords
    integrated circuit layout; logic design; superconducting logic circuits; 3D geometry; Cadence; InductEx; Josephson junction critical current extraction; circuit schematic extraction; full superconducting digital logic gate; full-gate layout verification; geometry-dependent parameters; layout network; layout-versus-schematic method; multiterminal network inductance; superconducting integrated circuit layouts; superconductor structure; tape-out ready layouts; Fabrication; Impedance; Inductance; Integrated circuit modeling; Layout; Ports (Computers); Resistance; InductEx; Inductance extraction; layout verification; three-dimensional modeling;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2014.2360870
  • Filename
    6913533