• DocumentCode
    1757332
  • Title

    Counterexample Ranking Using Mined Invariants

  • Author

    Mitra, Subhasish ; Banerjee, Adrish ; Dasgupta, Parthasarathi ; Kumar, Harish

  • Author_Institution
    IBM India Pvt. Ltd., Bangalore, India
  • Volume
    32
  • Issue
    12
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    1978
  • Lastpage
    1991
  • Abstract
    Bug-fixing in deeply embedded portions of the logic is typically accompanied by the postfacto addition of new assertions, which cover the bug scenario. Formally verifying the assertions defined over such deeply embedded portions of the logic is challenging because formal methods do not scale to the size of the entire logic. Verifying the assertion on the embedded logic in isolation typically throws up a large number of counterexamples, many of which are spurious because the scenarios they depict are not possible in the entire logic. In this paper, we introduce the notion of ranking the counterexamples so that only the most likely counterexamples are presented to the designer. Our ranking is based on assume properties mined from simulation traces of the entire logic. We define a metric to compute a belief for each assume property that is mined, and rank counterexamples based on their relationships with the mined assume properties. Experimental results demonstrate a remarkable correlation between the real counterexamples (if they exist) and the proposed ranking metric, thereby establishing the proposed method as a very promising verification approach.
  • Keywords
    decision trees; embedded systems; formal verification; logic design; bug fixing; counterexample ranking; embedded logic; formal methods; formal verification; logic design; mined invariants; ranking metric; Bayes methods; Decision trees; Formal verification; Simulation; Bayes methods; decision trees; formal verification; simulation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2013.2276627
  • Filename
    6663245