• DocumentCode
    1758674
  • Title

    Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area

  • Author

    Shuming Chen ; Yankang Du ; Biwei Liu ; Junrui Qin

  • Author_Institution
    Sci. & Technol. on Parallel & Distrib. Process. Lab., Nat. Univ. of Defense Technol., Changsha, China
  • Volume
    61
  • Issue
    1
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    646
  • Lastpage
    653
  • Abstract
    Concepts of effective sensitive area and effective SET pulse width are proposed to model the actual sensitive area. Simulation results present that the soft error vulnerabilities got by using the effective sensitive area can be almost an order larger than the ones got by using the normal approach when the ion LET is 30 MeV ·cm2/mg. And heavy-ion experiments are conducted to demonstrate the simulation results.
  • Keywords
    combinational circuits; radiation hardening (electronics); combinational circuits; effective SET pulse width; effective sensitive area; ion LET; single event transient; soft error vulnerabilities; Combinational circuits; Inverters; Ions; Layout; Logic gates; MOSFET; Effective sensitive area; SET; pulse width; soft error vulnerabilities;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2014.2298889
  • Filename
    6733406
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1758674