• DocumentCode
    1760233
  • Title

    Improving Throughput of Power-Constrained Many-Core Processors Based on Unreliable Devices

  • Author

    Hao Wang ; Nam Sung Kim

  • Author_Institution
    Univ. of Wisconsin-Madison, Madison, WI, USA
  • Volume
    33
  • Issue
    4
  • fYear
    2013
  • fDate
    July-Aug. 2013
  • Firstpage
    16
  • Lastpage
    24
  • Abstract
    Using slightly less device-level redundancy than is necessary to make all processor cores defect free actually makes cores smaller, faster, and more power efficient. Under the same power and yield constraints, a carbon nanotube processor with less device-level redundancy can provide 1.75x higher throughput, while also being nearly 2x smaller than a similar processor that has more device-level redundancy and makes all cores defect free.
  • Keywords
    carbon nanotubes; microprocessor chips; redundancy; carbon nanotube processor; device-level redundancy; power-constrained many-core processors; unreliable devices; yield constraints; CMOS integrated circuits; Carbon nanotubes; Inverters; Multicore processing; Power system reliability; Program processors; Redundancy; System-on-chip; carbon nanotube; many-core processor; power constraint; reliability;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2013.69
  • Filename
    6527885