DocumentCode
1760249
Title
Reliability, Theme Issues, and Plagiarism
Author
Altman, Erik R.
Author_Institution
Thomas J. Watson Research Center
Volume
33
Issue
4
fYear
2013
fDate
July-Aug. 2013
Firstpage
2
Lastpage
2
Abstract
This column discusses the special issue on reliability, <it>IEEE Micro</it>´s requirement that authors add new material to any previously published work, and issues of plagiarism.
Keywords
IEEE; hard errors; plagiarism; power; reliability; soft errors; temperature; theme issues; voltage;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/MM.2013.86
Filename
6585410
Link To Document