• DocumentCode
    1760783
  • Title

    Key Updating for Leakage Resiliency With Application to AES Modes of Operation

  • Author

    Taha, M. ; Schaumont, P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
  • Volume
    10
  • Issue
    3
  • fYear
    2015
  • fDate
    42064
  • Firstpage
    519
  • Lastpage
    528
  • Abstract
    Side-channel analysis (SCA) exploits the information leaked through unintentional outputs (e.g., power consumption) to reveal the secret key of cryptographic modules. The real threat of SCA lies in the ability to mount attacks over small parts of the key and to aggregate information over different encryptions. The threat of SCA can be thwarted by changing the secret key at every run. Indeed, many contributions in the domain of leakage resilient cryptography tried to achieve this goal. However, the proposed solutions were computationally intensive and were not designed to solve the problem of the current cryptographic schemes. In this paper, we propose a generic framework of lightweight key updating that can protect the current cryptographic standards and evaluate the minimum requirements for heuristic SCA-security. Then, we propose a complete solution to protect the implementation of any standard mode of Advanced Encryption Standard. Our solution maintains the same level of SCA-security (and sometimes better) as the state of the art, at a negligible area overhead while doubling the throughput of the best previous work.
  • Keywords
    cryptography; standards; AES operation mode; Advanced Encryption Standard; cryptographic schemes; cryptographic standards; heuristic SCA-security; key updating; leakage resiliency; leakage resilient cryptography modules; secret key; side-channel analysis; Ciphers; Hardware; Radiation detectors; Random variables; Standards; HWS-SIDE; Hardware Security (Side Channels); Hardware security (side channels);
  • fLanguage
    English
  • Journal_Title
    Information Forensics and Security, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1556-6013
  • Type

    jour

  • DOI
    10.1109/TIFS.2014.2383359
  • Filename
    6987331