• DocumentCode
    1763210
  • Title

    Underdesigned and Opportunistic Computing in Presence of Hardware Variability

  • Author

    Gupta, Puneet ; Agarwal, Yuvraj ; Dolecek, Lara ; Dutt, Nikil ; Gupta, Rajesh K. ; Kumar, Rakesh ; Mitra, Subhasish ; Nicolau, Alexandru ; Rosing, Tajana Simunic ; Srivastava, Mani B. ; Swanson, Steven ; Sylvester, Dennis

  • Author_Institution
    Univ. of California, Los Angeles, Los Angeles, CA, USA
  • Volume
    32
  • Issue
    1
  • fYear
    2013
  • fDate
    Jan. 2013
  • Firstpage
    8
  • Lastpage
    23
  • Abstract
    Microelectronic circuits exhibit increasing variations in performance, power consumption, and reliability parameters across the manufactured parts and across use of these parts over time in the field. These variations have led to increasing use of overdesign and guardbands in design and test to ensure yield and reliability with respect to a rigid set of datasheet specifications. This paper explores the possibility of constructing computing machines that purposely expose hardware variations to various layers of the system stack including software. This leads to the vision of underdesigned hardware that utilizes a software stack that opportunistically adapts to a sensed or modeled hardware. The envisioned underdesigned and opportunistic computing (UnO) machines face a number of challenges related to the sensing infrastructure and software interfaces that can effectively utilize the sensory data. In this paper, we outline specific sensing mechanisms that we have developed and their potential use in building UnO machines.
  • Keywords
    integrated circuit design; integrated circuit reliability; integrated circuit yield; low-power electronics; computing machines; datasheet specifications; hardware variability; microelectronic circuits; opportunistic computing; power consumption; reliability parameters; sensing infrastructure; software interfaces; software stack; underdesigned computing; yield; Ash; Benchmark testing; Hardware; Power demand; Power measurement; Software; Temperature measurement; Computer architecture; design automation; design for manufacture; digital integrated circuits; micro-procesors; reliability; system software;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2012.2223467
  • Filename
    6387697