• DocumentCode
    1763421
  • Title

    Static and Dynamic Photoelectrothermal Modeling of LED Lamps Including Low-Frequency Current Ripple Effects

  • Author

    Almeida, Pedro S. ; Bender, Vitor C. ; Braga, Henrique A. C. ; Dalla Costa, Marco A. ; Marchesan, Tiago B. ; Alonso, J. Marcos

  • Author_Institution
    Fed. Univ. of de Juiz de Fora, Juiz de Fora, Brazil
  • Volume
    30
  • Issue
    7
  • fYear
    2015
  • fDate
    42186
  • Firstpage
    3841
  • Lastpage
    3851
  • Abstract
    In this paper, a static and dynamic photoelectrothermal model including the impact of low-frequency current ripple on light-emitting diodes (LEDs) performance is proposed. The objective of this study is to evaluate the dynamical interaction among thermal, photometrical, and electrical properties of the LEDs when they are supplied by a dc constant current with a superposed low frequency sinusoidal ripple, which is the common case in offline LED drivers. Therefore, this paper presents both a model and experimental data for analyzing the LED photometrical behavior in terms of luminous flux, efficacy, flicker, and chromaticity. Three laboratory prototypes with different heat sinks and LED models have been tested. Experimental results are presented to evaluate the LED photometrical behavior under the aforementioned operating conditions and to validate the proposed modeling methodology.
  • Keywords
    LED lamps; driver circuits; heat sinks; thermal properties; DC constant current; LED drivers; LED lamps; LED photometrical; electrical properties; heat sinks; light-emitting diodes; low-frequency current ripple effects; photoelectrothermal modeling; photometrical properties; thermal properties; Equations; Heat sinks; Junctions; Light emitting diodes; Mathematical model; Temperature; Temperature measurement; LED photometrical model; light flicker; light-emitting diode (LED); low-frequency current ripple; offline LED drivers;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2014.2340352
  • Filename
    6858042