• DocumentCode
    1763426
  • Title

    Equi-Reflectance Dual Mode Resonance Using Bimetallic Loaded Dielectric Plasmonic Structure

  • Author

    Bera, Mahua ; Ray, Mina

  • Author_Institution
    Dept. of Appl. Opt. & Photonics, Univ. of Calcutta, Kolkata, India
  • Volume
    25
  • Issue
    20
  • fYear
    2013
  • fDate
    Oct.15, 2013
  • Firstpage
    1965
  • Lastpage
    1968
  • Abstract
    Theoretical study of the reflectance response of an asymmetrically-clad bimetallic film that supports coupled surface plasmon polariton modes has been presented. Through adjusting the relative thickness of the two metal film components, the relative coupling strength to the long range (LR) and short range plasmon modes can be altered. It is possible to obtain optimal and equi coupling (zero reflectivity) to both modes for given incident wavelength by further adjusting the overall thickness of bimetallic film. Simultaneous angular and spectral sensitivity calculations of resonance of the LR mode have been demonstrated for sensing application. Tailoring of the structure of individual metal films realizing equi- and non-equi-reflectance modes has been proposed which may further be used for plasmonic trinary logic using binary di-bit images.
  • Keywords
    infrared spectra; logic circuits; metallic thin films; plasmonics; polaritons; surface plasmon resonance; LR mode; angular sensitivity; asymmetrically-clad bimetallic film; bimetallic loaded dielectric plasmonic structure; binary di-bit images; equi coupling; equi-reflectance dual mode resonance; film thickness; long range plasmon mode; nonequi-reflectance modes; optimal coupling; plasmonic trinary logic; reflectance response; relative coupling strength; relative thickness; sensing application; short range plasmon mode; spectral sensitivity; surface plasmon polariton modes; zero reflectivity; Dielectrics; Films; Metals; Optical surface waves; Plasmons; Reflectivity; Sensitivity; Plasmonics; bimetallic; thin films;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2013.2279685
  • Filename
    6587135