• DocumentCode
    1763764
  • Title

    A High Temperature Silicon Carbide mosfet Power Module With Integrated Silicon-On-Insulator-Based Gate Drive

  • Author

    Zhiqiang Wang ; Xiaojie Shi ; Tolbert, Leon M. ; Wang, Fei Fred ; Zhenxian Liang ; Costinett, Daniel ; Blalock, Benjamin J.

  • Author_Institution
    Nat. Transp. Res. Center, Oak Ridge Nat. Lab., Knoxville, TN, USA
  • Volume
    30
  • Issue
    3
  • fYear
    2015
  • fDate
    42064
  • Firstpage
    1432
  • Lastpage
    1445
  • Abstract
    This paper presents a board-level integrated silicon carbide (SiC) mosfet power module for high temperature and high power density application. Specifically, a silicon-on-insulator (SOI)-based gate driver capable of operating at 200 °C ambient temperature is designed and fabricated. The sourcing and sinking current capability of the gate driver are tested under various ambient temperatures. Also, a 1200 V/100 A SiC mosfet phase-leg power module is developed utilizing high temperature packaging technologies. The static characteristics, switching performance, and short-circuit behavior of the fabricated power module are fully evaluated at different temperatures. Moreover, a buck converter prototype composed of the SOI gate driver and SiC power module is built for high temperature continuous operation. The converter is operated at different switching frequencies up to 100 kHz, with its junction temperature monitored by a thermosensitive electrical parameter and compared with thermal simulation results. The experimental results from the continuous operation demonstrate the high temperature capability of the power module at a junction temperature greater than 225 °C.
  • Keywords
    driver circuits; high-temperature electronics; modules; power MOSFET; semiconductor device packaging; silicon compounds; silicon-on-insulator; wide band gap semiconductors; MOSFET phase-leg power module; SOI; SiC; board-level integrated silicon carbide MOSFET power module; buck converter prototype; current 100 A; high temperature continuous operation; high temperature packaging technology; high temperature silicon carbide MOSFET power module; integrated silicon-on-insulator-based gate drive; junction temperature; short-circuit behavior; static characteristics; switching performance; temperature 200 degC; thermal simulation; thermosensitive electrical parameter; voltage 1200 V; Junctions; Logic gates; MOSFET; Multichip modules; Silicon carbide; Temperature; Temperature measurement; Power module; silicon carbide (SiC) mosfet; silicon-on-insulator (SOI); thermosensitive electrical parameter (TSEP);
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2014.2321174
  • Filename
    6808516