DocumentCode
1763764
Title
A High Temperature Silicon Carbide mosfet Power Module With Integrated Silicon-On-Insulator-Based Gate Drive
Author
Zhiqiang Wang ; Xiaojie Shi ; Tolbert, Leon M. ; Wang, Fei Fred ; Zhenxian Liang ; Costinett, Daniel ; Blalock, Benjamin J.
Author_Institution
Nat. Transp. Res. Center, Oak Ridge Nat. Lab., Knoxville, TN, USA
Volume
30
Issue
3
fYear
2015
fDate
42064
Firstpage
1432
Lastpage
1445
Abstract
This paper presents a board-level integrated silicon carbide (SiC) mosfet power module for high temperature and high power density application. Specifically, a silicon-on-insulator (SOI)-based gate driver capable of operating at 200 °C ambient temperature is designed and fabricated. The sourcing and sinking current capability of the gate driver are tested under various ambient temperatures. Also, a 1200 V/100 A SiC mosfet phase-leg power module is developed utilizing high temperature packaging technologies. The static characteristics, switching performance, and short-circuit behavior of the fabricated power module are fully evaluated at different temperatures. Moreover, a buck converter prototype composed of the SOI gate driver and SiC power module is built for high temperature continuous operation. The converter is operated at different switching frequencies up to 100 kHz, with its junction temperature monitored by a thermosensitive electrical parameter and compared with thermal simulation results. The experimental results from the continuous operation demonstrate the high temperature capability of the power module at a junction temperature greater than 225 °C.
Keywords
driver circuits; high-temperature electronics; modules; power MOSFET; semiconductor device packaging; silicon compounds; silicon-on-insulator; wide band gap semiconductors; MOSFET phase-leg power module; SOI; SiC; board-level integrated silicon carbide MOSFET power module; buck converter prototype; current 100 A; high temperature continuous operation; high temperature packaging technology; high temperature silicon carbide MOSFET power module; integrated silicon-on-insulator-based gate drive; junction temperature; short-circuit behavior; static characteristics; switching performance; temperature 200 degC; thermal simulation; thermosensitive electrical parameter; voltage 1200 V; Junctions; Logic gates; MOSFET; Multichip modules; Silicon carbide; Temperature; Temperature measurement; Power module; silicon carbide (SiC) mosfet; silicon-on-insulator (SOI); thermosensitive electrical parameter (TSEP);
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2014.2321174
Filename
6808516
Link To Document