DocumentCode
1763955
Title
Monitoring of the Thermal Strain Distribution in CICCs During the Cyclic Loading Tests in SULTAN
Author
Calzolaio, Ciro ; Bruzzone, Pierluigi ; Stepanov, Boris
Author_Institution
EPFL-CRPP, Fusion Technol., Villigen, Switzerland
Volume
23
Issue
3
fYear
2013
fDate
41426
Firstpage
4200404
Lastpage
4200404
Abstract
A technique to measure in situ the behavior of the magnetic susceptibility vs. temperature, χ(T), for a cable-in-conduit-conductor (CICC) in the SULTAN test facility has been developed. The same kind of measurements are performed for the corresponding free standing filaments used for the cable manufacturing. The comparison of both the χ(T) curves allows at first to measure the critical temperature (Tc) distribution in the CICC cross-section and then to infer from that the corresponding thermal strain distribution (εth). The εth plays an important role in the monitoring of the performance degradation that a CICC experiences when it undergoes an electromagnetic cyclic load, allowing also to discriminate between reversible and irreversible degradation. A broadening of the strain distribution with the number of cycles is visible. The strain distribution was measured for both toroidal field samples and central solenoid samples. In both cases the εth distributions have peaks at negative strain but the toroidal field sample distributions show a larger percentage of filaments in the tensile region.
Keywords
conductors (electric); magnetic susceptibility; superconducting cables; superconducting device testing; superconducting transition temperature; temperature distribution; CICC; SULTAN test facility; cable manufacturing; cable-in-conduit-conductor; central solenoid samples; critical temperature; cyclic loading tests; electromagnetic cyclic load; irreversible degradation; magnetic susceptibility; performance degradation; thermal strain distribution; toroidal field sample distributions; Bars; Coils; Niobium-tin; Power cables; Strain; Strain measurement; Temperature measurement; CICC; critical temperature; degradation; magnetic susceptibility; thermal strain;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2012.2235492
Filename
6389720
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