DocumentCode
1764556
Title
Probability Models for Open Set Recognition
Author
Scheirer, Walter J. ; Jain, Lalit P. ; Boult, Terrance E.
Author_Institution
Dept. of Mol. & Cellular Biol., Harvard Univ., Cambridge, MA, USA
Volume
36
Issue
11
fYear
2014
fDate
Nov. 1 2014
Firstpage
2317
Lastpage
2324
Abstract
Real-world tasks in computer vision often touch upon open set recognition: multi-class recognition with incomplete knowledge of the world and many unknown inputs. Recent work on this problem has proposed a model incorporating an open space risk term to account for the space beyond the reasonable support of known classes. This paper extends the general idea of open space risk limiting classification to accommodate non-linear classifiers in a multiclass setting. We introduce a new open set recognition model called compact abating probability (CAP), where the probability of class membership decreases in value (abates) as points move from known data toward open space. We show that CAP models improve open set recognition for multiple algorithms. Leveraging the CAP formulation, we go on to describe the novel Weibull-calibrated SVM (W-SVM) algorithm, which combines the useful properties of statistical extreme value theory for score calibration with one-class and binary support vector machines. Our experiments show that the W-SVM is significantly better for open set object detection and OCR problems when compared to the state-of-the-art for the same tasks.
Keywords
computer vision; image classification; learning (artificial intelligence); object detection; object recognition; probability; statistical analysis; support vector machines; CAP; OCR problem; W-SVM algorithm; Weibull-calibrated SVM algorithm; binary support vector machines; class membership probability; compact abating probability; computer vision; machine learning; multiclass recognition; nonlinear classifiers; one-class support vector machines; open set object detection problem; open set recognition model; open space risk limiting classification; open space risk term; probability models; score calibration; statistical extreme value theory; Computational modeling; Data models; Kernel; Probabilistic logic; Probability; Support vector machines; Training; Machine learning; open set recognition; statistical extreme value theory; support vector machines;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2014.2321392
Filename
6809169
Link To Document