• DocumentCode
    1764556
  • Title

    Probability Models for Open Set Recognition

  • Author

    Scheirer, Walter J. ; Jain, Lalit P. ; Boult, Terrance E.

  • Author_Institution
    Dept. of Mol. & Cellular Biol., Harvard Univ., Cambridge, MA, USA
  • Volume
    36
  • Issue
    11
  • fYear
    2014
  • fDate
    Nov. 1 2014
  • Firstpage
    2317
  • Lastpage
    2324
  • Abstract
    Real-world tasks in computer vision often touch upon open set recognition: multi-class recognition with incomplete knowledge of the world and many unknown inputs. Recent work on this problem has proposed a model incorporating an open space risk term to account for the space beyond the reasonable support of known classes. This paper extends the general idea of open space risk limiting classification to accommodate non-linear classifiers in a multiclass setting. We introduce a new open set recognition model called compact abating probability (CAP), where the probability of class membership decreases in value (abates) as points move from known data toward open space. We show that CAP models improve open set recognition for multiple algorithms. Leveraging the CAP formulation, we go on to describe the novel Weibull-calibrated SVM (W-SVM) algorithm, which combines the useful properties of statistical extreme value theory for score calibration with one-class and binary support vector machines. Our experiments show that the W-SVM is significantly better for open set object detection and OCR problems when compared to the state-of-the-art for the same tasks.
  • Keywords
    computer vision; image classification; learning (artificial intelligence); object detection; object recognition; probability; statistical analysis; support vector machines; CAP; OCR problem; W-SVM algorithm; Weibull-calibrated SVM algorithm; binary support vector machines; class membership probability; compact abating probability; computer vision; machine learning; multiclass recognition; nonlinear classifiers; one-class support vector machines; open set object detection problem; open set recognition model; open space risk limiting classification; open space risk term; probability models; score calibration; statistical extreme value theory; Computational modeling; Data models; Kernel; Probabilistic logic; Probability; Support vector machines; Training; Machine learning; open set recognition; statistical extreme value theory; support vector machines;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2014.2321392
  • Filename
    6809169