• DocumentCode
    1769006
  • Title

    Extensional design for noise-tolerate MRF standard cells via global mapping

  • Author

    Yan Li ; Jianhao Hu

  • Author_Institution
    Nat. key Lab. of Commun., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2014
  • fDate
    1-5 June 2014
  • Firstpage
    1728
  • Lastpage
    1731
  • Abstract
    As CMOS devices scaling down according to the Moore´ law, the reliability and stability of circuit become the main challenge for the chip designs in low supply voltage. Markov Random field (MRF) based design methodology presents a new approach to establish high noise-immune structure for low-power circuit design from the viewpoint of energy. We use global mapping to synthesize all two-input functions and realize the MRF based circuits, then the final structures our provided with same complexity, which does not depend on the inside logic operations any more, but the number of the input-signal instead, which inspires us to extend the MRF standard cells. Our proposed structures keep the performance of fault-tolerance and achieve higher efficiency for energy, time and area compared with that of traditional MRF-circuits. The extensional basic units also can beneficial for saving area in multi-level MRF-circuit.
  • Keywords
    CMOS digital integrated circuits; CMOS logic circuits; Markov processes; fault tolerance; integrated circuit design; integrated circuit reliability; logic design; low-power electronics; CMOS devices; MRF standard cells; Markov random field; Moore law; chip designs; fault tolerance; global mapping; integrated circuit design; integrated circuit reliability; low-power circuit design; multilevel MRF circuit; noise-immune structure; CMOS integrated circuits; Circuit synthesis; Complexity theory; Logic functions; Markov random fields; Noise; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2014 IEEE International Symposium on
  • Conference_Location
    Melbourne VIC
  • Print_ISBN
    978-1-4799-3431-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2014.6865488
  • Filename
    6865488