The accelerated degradation test and evaluation methods for printed circuit board coatings

Based on the traditional neutral salt fog test, a newly step-stress accelerated degradation test is designed which adds temperature as a step-stress condition. It is proved that the test process is accelerated obviously. The degradation data measured from insulation resistance of printed circuit board could be fitted into degradation curves. Using Arrhenius Equation to build temperature accelerating equations, the reliability curves of the printed circuit board and the coating life could be predicted in salt fog test at 30´C. According to the results, it is found that the accelerated test is reasonable.