• DocumentCode
    1772826
  • Title

    Reliable execution of statechart-generated correct embedded software under soft errors

  • Author

    Ferreira, Ronaldo R. ; Klotz, Thomas ; Vortler, Thilo ; da Rolt, Jean ; Nazar, Gabriel L. ; Moreira, Alvaro F. ; Carro, Luigi ; Einwich, Karsten

  • Author_Institution
    Inst. de Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
  • fYear
    2014
  • fDate
    23-25 April 2014
  • Firstpage
    147
  • Lastpage
    152
  • Abstract
    This paper proposes a design methodology for fault-tolerant embedded systems development that starts from software specification and goes down to hardware execution. The proposed design methodology uses formally verified and correct-by-construction software created from high-level UML statechart models for software specification and implementation. On the hardware reliability side, this paper uses the MoMa architecture for reliable embedded computing which we deploy as a soft-core onto an off-the-shelf FPGA. MoMa introduces architectural innovations that support the semantics of the UML statechart execution in a reliable fashion. The proposed design methodology is evaluated with a real automotive case study based on an exhaustive FPGA-implemented fault injection campaign.
  • Keywords
    Unified Modeling Language; embedded systems; formal specification; formal verification; software fault tolerance; MoMa architecture; Unified Modelling Language; automotive case study; correct-by-construction software; design methodology; exhaustive FPGA-implemented fault injection campaign; fault-tolerant embedded systems development; field programmable gate array; formally verified software; hardware execution; hardware reliability; high-level UML statechart models; reliable embedded computing; reliable software execution; soft errors; software specification; statechart-generated correct embedded software; Circuit faults; Design methodology; Hardware; Software; Software reliability; Unified modeling language; Model-driven engineering; fault-tolerance; reliability; soft-errors; statecharts;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits & Systems, 17th International Symposium on
  • Conference_Location
    Warsaw
  • Print_ISBN
    978-1-4799-4560-3
  • Type

    conf

  • DOI
    10.1109/DDECS.2014.6868779
  • Filename
    6868779