COTS FPGA/SRAM irradiations using a dedicated testing infrastructure for characterization of large component batches

Author

Uznanski, Slawosz ; Todd, Benjamin ; Walter, Johannes ; Vilar-Villanueva, Andrea

Author_Institution

Technol. Dept., Eur. Organ. for Nucl. Res. (CERN), Meyrin, Switzerland

fYear

2014

fDate

19-21 June 2014

Firstpage

381

Lastpage

384

Abstract

This paper introduces a new testing platform for irradiation of large batches of COTS FPGA and SRAMs. The main objective is measurement of component radiation response and assessment of component-to-component variability within one batch. The first validation and test results using the testing platform are presented for 150nm TFT SRAM (Renesas) and different sizes of the 130nm ProASIC3 FPGA (Microsemi).

Keywords

SRAM chips; field programmable gate arrays; integrated circuit testing; logic testing; radiation hardening (electronics); COTS FPGA-SRAM irradiations; ProASIC3 FPGA; TFT SRAM; component radiation response measurement; component-to-component variability; dedicated testing infrastructure; large component batches characterization; size 130 nm; size 150 nm; testing platform; Collimators; Field programmable gate arrays; Large Hadron Collider; Protons; Radiation effects; Random access memory; Commercial-Off-The-Shelf (COTS) components; Field Programmable Gate Array (FPGA); Single Event Effects (SEE); Static Random Access Memory (SRAM); Total Ioninzing Dose (TID);

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed Design of Integrated Circuits & Systems (MIXDES), 2014 Proceedings of the 21st International Conference

Conference_Location

Lublin

Print_ISBN

978-83-63578-03-9

Type

conf

DOI

10.1109/MIXDES.2014.6872223

Filename

6872223