• DocumentCode
    1777629
  • Title

    Methodology modeling of MaE-fabricated Porous Silicon Nanowires

  • Author

    Antidormi, Aleandro ; Chiabrando, Diego ; Graziano, Maria Grazia ; Boarino, Luca ; Piccinini, Gianluca

  • Author_Institution
    Dept. of Electron. & Telecommun., Politec. di Torino, Turin, Italy
  • fYear
    2014
  • fDate
    June 30 2014-July 3 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Porous Silicon Nanowires (PS-NWs) represent very promising electronic devices with a wide range of applications, all taking advantage of the irregular microscopic structure of PS. The strong variability of the electrical properties of the material with technological process makes computer simulation of PS-nanowires a cumbersome task. Here we present a simple model of PS-NWs which can be implemented for simulations in physics-based software TCAD Atlas thus giving a contribution to the investigation of the effects of the peculiar structure on the material resistivity. Extensive simulations have been performed on PS-Nws with microscopic characteristics deduced from our experimental fabricated devices. We investigated the dependence of current from applied voltage and channel doping also in relation with the electrical field inside the device and with the carriers´ mobility. Finally we suggest an electrical model for PS-NWs easily implemented in commercial circuit simulators (Eldo in this case). It will allow to exploit the actual simulation tools also for the analysis and design of circuits where PS-based devices are present.
  • Keywords
    carrier mobility; elemental semiconductors; nanowires; porous semiconductors; silicon; technology CAD (electronics); MaE-fabricated porous silicon nanowires; PS microscopic structure; PS-NW; PS-based devices; PS-nanowires; applied voltage; carrier mobility; channel doping; commercial circuit simulators; computer simulation; electrical field; electrical model; electrical properties; electronic devices; material resistivity; microscopic characteristics; physics-based software TCAD Atlas; technological process; Analytical models; Computational modeling; Conductivity; Integrated circuit modeling; Nanowires; Semiconductor process modeling; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ph.D. Research in Microelectronics and Electronics (PRIME), 2014 10th Conference on
  • Conference_Location
    Grenoble
  • Type

    conf

  • DOI
    10.1109/PRIME.2014.6872732
  • Filename
    6872732