• DocumentCode
    1778146
  • Title

    Exploiting a fast and simple ECC for scaling supply voltage in level-1 caches

  • Author

    Yalcin, Gulay ; Islek, Emrah ; Tozlu, Oyku ; Reviriego, Pedro ; Cristal, Adrian ; Unsal, Osman S. ; Ergin, Oguz

  • Author_Institution
    Barcelona Supercomput. Center, Barcelona, Spain
  • fYear
    2014
  • fDate
    7-9 July 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Scaling supply voltage to near-threshold is a very effective approach in reducing the energy consumption of computer systems. However, executing below the safe operation margin of supply voltage introduces high number of persistent failures, especially in memory structures. Thus, it is essential to provide reliability schemes to tolerate these persistent failures in the memory structures. In this study, we adopt a Single Error Correction Multiple Adjacent Error Correction (SEC-MAEC) code in order to minimize the energy consumption of L1 caches. In our evaluations, we present that the SEC-MAEC code is a fast and energy efficient Error Correcting Code (ECC). It presents 10X less area overhead and 2X less latency for the decoder compared to Orthogonal Latin Square Code, the state-of-the art ECC utilized in the L1 cache under the scaling supply voltage.
  • Keywords
    cache storage; decoding; error correction codes; ECC; L1 cache; SEC-MAEC code; computer system; decoder; energy consumption; level-1 cache; memory structure; orthogonal latin square code; reliability scheme; scaling supply voltage; single error correction multiple adjacent error correction code; Decoding; Encoding; Energy consumption; Error correction; Error correction codes; Logic gates; Organizations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
  • Conference_Location
    Platja d´Aro, Girona
  • Type

    conf

  • DOI
    10.1109/IOLTS.2014.6873660
  • Filename
    6873660