DocumentCode
1778146
Title
Exploiting a fast and simple ECC for scaling supply voltage in level-1 caches
Author
Yalcin, Gulay ; Islek, Emrah ; Tozlu, Oyku ; Reviriego, Pedro ; Cristal, Adrian ; Unsal, Osman S. ; Ergin, Oguz
Author_Institution
Barcelona Supercomput. Center, Barcelona, Spain
fYear
2014
fDate
7-9 July 2014
Firstpage
1
Lastpage
6
Abstract
Scaling supply voltage to near-threshold is a very effective approach in reducing the energy consumption of computer systems. However, executing below the safe operation margin of supply voltage introduces high number of persistent failures, especially in memory structures. Thus, it is essential to provide reliability schemes to tolerate these persistent failures in the memory structures. In this study, we adopt a Single Error Correction Multiple Adjacent Error Correction (SEC-MAEC) code in order to minimize the energy consumption of L1 caches. In our evaluations, we present that the SEC-MAEC code is a fast and energy efficient Error Correcting Code (ECC). It presents 10X less area overhead and 2X less latency for the decoder compared to Orthogonal Latin Square Code, the state-of-the art ECC utilized in the L1 cache under the scaling supply voltage.
Keywords
cache storage; decoding; error correction codes; ECC; L1 cache; SEC-MAEC code; computer system; decoder; energy consumption; level-1 cache; memory structure; orthogonal latin square code; reliability scheme; scaling supply voltage; single error correction multiple adjacent error correction code; Decoding; Encoding; Energy consumption; Error correction; Error correction codes; Logic gates; Organizations;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
Conference_Location
Platja d´Aro, Girona
Type
conf
DOI
10.1109/IOLTS.2014.6873660
Filename
6873660
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