• DocumentCode
    1778203
  • Title

    Effect of ionizing radiation on TRNGs for safe telecommunications: Robustness and randomness

  • Author

    Martin, Harold ; Vaskova, A. ; Lopez-Ongil, C. ; San Millan, Enrique ; Portela-Garcia, M.

  • Author_Institution
    Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain
  • fYear
    2014
  • fDate
    7-9 July 2014
  • Firstpage
    202
  • Lastpage
    205
  • Abstract
    True-random number generators (TRNGs) are being recently defined, designed and prototyped on digital electronic circuits, like part of encryption and decryption algorithms. They provide very interesting results in terms of security and cost. In harsh environments, like aerospace applications, Single Event Upsets (SEUs) are a main concern. TRNGs are currently used in satellite communications to enhance security by ciphering critical data. This work studies the effects of SEUs on a particular architecture of TRNGs. The analysis is performed by injecting fault models in a physical TRNG implementation.
  • Keywords
    SRAM chips; cryptography; field programmable gate arrays; radiation hardening (electronics); random number generation; satellite communication; telecommunication security; SRAM-based FPGA; TRNGs; aerospace applications; critical data ciphering; decryption algorithms; digital electronic circuits; encryption algorithms; fault injection models; harsh environments; ionizing radiation effect; satellite communications; security enhancement; single event upsets; telecommunication safety; true-random number generators; Circuit faults; Field programmable gate arrays; Generators; Integrated circuit modeling; NIST; Registers; Security; Ionaizing radiation; SEU; TRNG; fault-tolerant; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International
  • Conference_Location
    Platja d´Aro, Girona
  • Type

    conf

  • DOI
    10.1109/IOLTS.2014.6873697
  • Filename
    6873697