Simple directly modulated laser diode frequency characterization using calibrated PD by two-tone light MZM method

Author

Potha, Sangdaun ; Siripon, Nipapon ; Mankong, Ukrit ; Inagaki, K. ; Kawanishi, Tetsuyas

Author_Institution

Dept. of Electr. Eng., Chiang Mai Univ., Chiang Mai, Thailand

fYear

2014

fDate

20-23 Oct. 2014

Firstpage

237

Lastpage

239

Abstract

This paper demonstrates frequency response characterization of a directly modulated laser diode (bandwidth 2.5GHz) using a calibrated photodetector (bandwidth 15 GHz). This work complements our previous work in obtaining frequency response of both E/O and O/E components where only simple equipment setup is required. We discuss the issues affecting the accuracy. The results are compared with those measured by a lightwave component analyzer.

Keywords

Mach-Zehnder interferometers; laser beams; laser variables measurement; optical modulation; photodetectors; semiconductor lasers; E/O components; O/E components; PD; bandwidth 15 GHz; bandwidth 2.5 GHz; frequency response characterization; lightwave component analyzer; photodetector; simple directly modulated laser diode frequency characterization; simple equipment setup; two-tone light MZM method; Diode lasers; Frequency response; Masers; Microwave measurement; Microwave photonics; Radio frequency; Directly Modulated Laser; Frequency Response; Optoelectronics; Scattering parameters;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Photonics (MWP) and the 2014 9th Asia-Pacific Microwave Photonics Conference (APMP), 2014 International Topical Meeting on

Conference_Location

Sapporo

Type

conf

DOI

10.1109/MWP.2014.6994541

Filename

6994541