• DocumentCode
    1780669
  • Title

    Universal sequential outlier hypothesis testing

  • Author

    Yun Li ; Nitinawarat, S. ; Veeravalli, Venugopal V.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2014
  • fDate
    June 29 2014-July 4 2014
  • Firstpage
    3205
  • Lastpage
    3209
  • Abstract
    Universal outlier hypothesis testing is studied in a sequential setting. Multiple observation sequences are collected, one of which is an outlier. Observations in the outlier sequence are generated by a unique mechanism, different from that generating the observations in all other sequences. The goal is to design a universal test to best discern the outlier sequence with the fewest observations on average. Based on the Multihypothesis Sequential Probability Ratio Test and the generalized likelihood test, a universal test is proposed and shown to be universally exponentially consistent. A lower bound on the achievable error exponents of such a test is derived. The proposed test can be modified to accommodate an additional null hypothesis with no outlier. In particular, it is shown to be consistent under the null hypothesis while retaining universally exponential consistency under all other hypotheses.
  • Keywords
    probability; sequences; generalized likelihood test; multihypothesis sequential probability ratio test; multiple observation sequences; sequential setting; universal sequential outlier hypothesis testing; Error probability; Information theory; Manganese; Maximum likelihood estimation; Sociology; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory (ISIT), 2014 IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • Type

    conf

  • DOI
    10.1109/ISIT.2014.6875426
  • Filename
    6875426