Application of Generalized Equivalent Circuits (GEC) method for Calculating of the diffraction by dielectric obstacles with finite thickness in metallic waveguide: Application to the characterization of vegetation leaves

Author

Krraoui, Houssemeddine ; Aguili, Taoufik

Author_Institution

Nat. Eng. Sch. of Tunis, ENIT, Tunis, Tunisia

fYear

2014

fDate

10-11 Nov. 2014

Firstpage

617

Lastpage

621

Abstract

In this paper, we develop an electromagnetic analysis of a rectangular waveguide loaded with a dielectric model that is composed of a leaf plant with a finite thickness. By applying the Generalized Equivalent Circuits (GEC), we can determine the wave diffraction according to the dielectric properties. To validate this work, our obtained results are compared with those previously published and measured. We have seen a good agreement is presented.

Keywords

computational electromagnetics; dielectric properties; dielectric-loaded waveguides; electromagnetic wave diffraction; equivalent circuits; vegetation; waveguide theory; GEC method; dielectric obstacles; dielectric properties; electromagnetic analysis; finite thickness; generalized equivalent circuit method; metallic waveguide; vegetation leaves characterization; wave diffraction calculation; Admittance; Dielectrics; Electromagnetic waveguides; Equations; Equivalent circuits; Mathematical model; Microwave circuits; Biological system modeling; Dielectric loaded waveguides; Equivalent circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Conference (LAPC), 2014 Loughborough

Conference_Location

Loughborough

Type

conf

DOI

10.1109/LAPC.2014.6996467

Filename

6996467