Quantitative measures for electromagnetic compatibility analysis of electronic systems

In this paper, for the first time, quantitative measures are proposed for susceptibility of electronic systems implemented on printed circuit boards. The sub-circuits of a complex system are considered at their connecting leads and traces. The threshold levels of fault occurrence are categorized for both digital and analog sub-systems. For analog circuits the Maximum worst case, THD, ripple, RMS, and power of induced voltage are chosen to be the measures for functional immunity of electronic systems against external threats. In addition, for digital circuits, induced jitter, eye-diagram closure, and Maximum worst case are chosen to be the criteria of quantization.