DocumentCode
1786140
Title
A single-stage cryogenic LNA with low power consumption using a commercial SiGe HBT
Author
Mani, Hamdi ; Mauskopf, Phillip
Author_Institution
Sch. of Earth & Space Exploration, Arizona State Univ., Tempe, AZ, USA
fYear
2014
fDate
7-9 July 2014
Firstpage
17
Lastpage
20
Abstract
A cryogenically cooled low noise amplifier (LNA) has been designed, built and tested at the Astronomy Instrumentation Laboratory at Arizona State University. The LNA uses low cost, off the shelf commercially available low noise SiGe hetero junction bipolar transistor (HBT) in a single stage surface mount package. The built LNA has been measured in a calibrated noise/gain/S-parameters setup and the data shows the LNA has a noise temperature of as low as 5K (or about 0.074dB noise figure) and more than 20dB of Gain on the 100MHz-1GHz band. The input and output of the LNA are matched to 50 Ohm, an S11 and S22 of less than -10dB at most frequencies have been measured. All these parameters were measured at different transistor bias points and power dissipations. The amplifier was operated at as low as 0.7mW power dissipation with a measured 8K of noise (or about 0.12dB Noise figure) and 20dB of Gain at 500MHz. The developed amplifier offered good performance at an extremely low cost and with a very short development time, this amplifier can be useful to a variety low temperature physics experiments.
Keywords
Ge-Si alloys; S-parameters; cryogenic electronics; heterojunction bipolar transistors; low noise amplifiers; low-power electronics; semiconductor device noise; Arizona State University; Astronomy Instrumentation Laboratory; SiGe; calibrated noise-gain-S-parameter setup; commercial silicon-germanium HBT; cryogenically-cooled low noise amplifier; frequency 100 MHz to 1 GHz; gain 20 dB; low-noise silicon-germanium heterojunction bipolar transistor; low-power consumption; low-temperature physics experiments; noise temperature; power 0.7 mW; power dissipation; resistance 50 ohm; single-stage cryogenic LNA; single-stage surface mount package; temperature 5 K; transistor bias point; Cryogenics; Current measurement; Extraterrestrial measurements; Noise; Noise measurement; Transistors; SiGe Heterojunction bipolar transistor; cryogenic; feedback amplifier; low noise amplifier; noise temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Temperature Electronics (WOLTE), 2014 11th International Workshop on
Conference_Location
Grenoble
Type
conf
DOI
10.1109/WOLTE.2014.6881015
Filename
6881015
Link To Document