• DocumentCode
    1790401
  • Title

    Patch-based over-exposure correction in image

  • Author

    Yeo-Jin Yoon ; Dae-Hong Lee ; Seok-Jae Kang ; Park, Won-Jae ; Sung-Jea Ko

  • Author_Institution
    Sch. of Electr. Eng., Korea Univ., Seoul, South Korea
  • fYear
    2014
  • fDate
    22-25 June 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Most of conventional over-exposure correction methods fail to reconstruct the detail information of the overexposed region (OER) in an image. This paper presents a novel method which can effectively reconstruct the texture as well as the luminance and the color of the OER without user interaction. The proposed method is performed based on a patch-based region filling method. In a patch including the over-exposed pixels, new luminance values are progressively estimated according to the luminance variation in the reference patch (RP) which is selected in the well-exposed region. For the color correction of the OER, the color values of the RP are simply copied. Once the OER is completely filled, the resultant image is refined using the Gaussian-based filters. Experimental results demonstrate that the proposed method provides more preferable results than conventional one.
  • Keywords
    Gaussian processes; filtering theory; image colour analysis; image reconstruction; image texture; Gaussian-based filters; OER color reconstruction; OER luminance reconstruction; RP color value; color correction; detail information reconstruction; luminance value estimation; luminance variation; over-exposed pixels; overexposed region; patch-based over-exposure correction method; patch-based region filling method; reference patch; texture reconstruction; Dynamic range; Educational institutions; Filling; Filtering; Image color analysis; Image reconstruction; Image restoration; Image enhancement; over-exposure correction; patch-based processing; region filling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics (ISCE 2014), The 18th IEEE International Symposium on
  • Conference_Location
    JeJu Island
  • Type

    conf

  • DOI
    10.1109/ISCE.2014.6884423
  • Filename
    6884423