DocumentCode
1790593
Title
Cartilage-defect assessment by measuring thickness of knee MRI: Data from the osteoarthritis initiative
Author
Yong-woo Lee ; Bui Toan ; Chunsoo Ahn ; Jitae Shin
Author_Institution
Sch. of Electron. & Electr. Eng., Sungkyunkwan Univ., Suwon, South Korea
fYear
2014
fDate
22-25 June 2014
Firstpage
1
Lastpage
2
Abstract
In this paper, we present a knee cartilage assessment technique to differentiate those in different osteoarthritis grades. We construct atlas for each grade and each atlas represents an average size of cartilage thickness. We build the atlas using manual segmentation of patellar cartilage following groupwise registration. We assign thickness value at the voxels in bone-cartilage interface in ahead. The thickness atlas is used for t-test to see how our method is accurate. T-test result shows our method finds significant difference between osteoarthritis grade 0 and 4 with p less than 0.001.
Keywords
biomedical MRI; bone; diseases; image registration; image segmentation; medical image processing; statistical testing; thickness measurement; bone-cartilage interface; cartilage thickness; cartilage-defect assessment; image registration; knee MRI; knee cartilage assessment technique; knee thickness measurement; manual image segmentation; osteoarthritis grades; osteoarthritis initiative; patellar cartilage; t-test; thickness atlas; Bones; Educational institutions; Image registration; Magnetic resonance imaging; Manuals; Osteoarthritis; Thickness measurement; cartilage thickness; image registration; magnetic resonance imaging; osteoarthritis; osteoarthritis grade; t-test;
fLanguage
English
Publisher
ieee
Conference_Titel
Consumer Electronics (ISCE 2014), The 18th IEEE International Symposium on
Conference_Location
JeJu Island
Type
conf
DOI
10.1109/ISCE.2014.6884524
Filename
6884524
Link To Document