• DocumentCode
    1790593
  • Title

    Cartilage-defect assessment by measuring thickness of knee MRI: Data from the osteoarthritis initiative

  • Author

    Yong-woo Lee ; Bui Toan ; Chunsoo Ahn ; Jitae Shin

  • Author_Institution
    Sch. of Electron. & Electr. Eng., Sungkyunkwan Univ., Suwon, South Korea
  • fYear
    2014
  • fDate
    22-25 June 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, we present a knee cartilage assessment technique to differentiate those in different osteoarthritis grades. We construct atlas for each grade and each atlas represents an average size of cartilage thickness. We build the atlas using manual segmentation of patellar cartilage following groupwise registration. We assign thickness value at the voxels in bone-cartilage interface in ahead. The thickness atlas is used for t-test to see how our method is accurate. T-test result shows our method finds significant difference between osteoarthritis grade 0 and 4 with p less than 0.001.
  • Keywords
    biomedical MRI; bone; diseases; image registration; image segmentation; medical image processing; statistical testing; thickness measurement; bone-cartilage interface; cartilage thickness; cartilage-defect assessment; image registration; knee MRI; knee cartilage assessment technique; knee thickness measurement; manual image segmentation; osteoarthritis grades; osteoarthritis initiative; patellar cartilage; t-test; thickness atlas; Bones; Educational institutions; Image registration; Magnetic resonance imaging; Manuals; Osteoarthritis; Thickness measurement; cartilage thickness; image registration; magnetic resonance imaging; osteoarthritis; osteoarthritis grade; t-test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics (ISCE 2014), The 18th IEEE International Symposium on
  • Conference_Location
    JeJu Island
  • Type

    conf

  • DOI
    10.1109/ISCE.2014.6884524
  • Filename
    6884524