• DocumentCode
    1791922
  • Title

    ELDRS Characterization of Texas Instruments LM185, 1.2V Precision Reference: Retrograde Behavior Demonstrates Why Taking Interim Test Points Is Important

  • Author

    Kruckmeyer, Kirby ; Thang Trinh

  • Author_Institution
    Texas Instrum., Santa Clara, CA, USA
  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The LM185 1.2V reference voltage degraded through total ionizing dose radiation, but began to recover at around 70 krad. The recovery curve was different for high and low dose rates and biased and unbiased test conditions.
  • Keywords
    radiation hardening (electronics); testing; ELDRS characterization; LM185 reference voltage; Texas Instruments LM185 precision reference; biased test conditions; enhanced low dose rate sensitivity characterization; high dose rates; interim test points; low dose rates; recovery curve; retrograde behavior; total ionizing dose radiation; unbiased test conditions; voltage 1.2 V; Breakdown voltage; Military standards; Radiation effects; Temperature distribution; Test facilities; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004567
  • Filename
    7004567
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1791922