• DocumentCode
    1791968
  • Title

    SEE Testing Results for RF and Microwave ICs

  • Author

    Chukov, George V. ; Elesin, Vadim V. ; Nazarova, Galina N. ; Nikiforov, Alexander Y. ; Boychenko, Dmitry V. ; Telets, Vitaliy A. ; Kuznetsov, Alexander G. ; Amburkin, Konstantin M.

  • Author_Institution
    Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
  • fYear
    2014
  • fDate
    14-18 July 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A short overview of single event effects for a variety of RF and microwave ICs is presented. New results obtained at the SPELS test center have been used along with published data.
  • Keywords
    integrated circuit design; microwave integrated circuits; radiation hardening (electronics); RF integrated circuits; SEE testing results; SPELS test center; microwave IC; single event effects; CMOS integrated circuits; Microwave FET integrated circuits; Microwave amplifiers; Microwave circuits; Microwave integrated circuits; Microwave oscillators; Radiation effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2014 IEEE
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-5883-2
  • Type

    conf

  • DOI
    10.1109/REDW.2014.7004589
  • Filename
    7004589
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1791968