PbS doped silicate glasses for radiation control in near IR lasers: Optical and structural characterization

Author

Onushchenko, A.A. ; Golubkov, V.V. ; Kalmykov, A.E. ; Staselko, D.I.

Author_Institution

NITIOM S.I .Vavilov State Opt. Inst., St. Petersburg, Russia

fYear

2014

fDate

June 30 2014-July 4 2014

Firstpage

1

Lastpage

1

Abstract

Structural regularities of lead sulfide doped glasses containing narrow gap PbS nanocrystals have been studied. The precipitation of the semiconductor phase is confirmed by X-ray diffraction data. Angular dependencies of SAXS intensity of the studied samples as well as their TEM images clearly show formation of nearly monodisperse ensemble of PbS nanocrystals.

Keywords

IV-VI semiconductors; X-ray diffraction; X-ray scattering; lead compounds; nanostructured materials; optical glass; precipitation (physical chemistry); silicon compounds; solid lasers; transmission electron microscopy; PbS doped silicate glasses; PbS-SiO₂; SAXS intensity; TEM images; X-ray diffraction; angular dependencies; monodisperse ensemble; narrow gap PbS nanocrystals; near IR lasers; precipitation; radiation control; semiconductor phase; structural regularities; Glass; Nanocrystals; Optical diffraction; Optical fibers; Optical imaging; PbS doped slicate glasses; PbS nanocrystals (NCs); low NCs size dispersion; structural characterization;

fLanguage

English

Publisher

ieee

Conference_Titel

Laser Optics, 2014 International Conference

Conference_Location

Saint Petersburg

Print_ISBN

978-1-4799-3884-1

Type

conf

DOI

10.1109/LO.2014.6886207

Filename

6886207