• DocumentCode
    1796679
  • Title

    Product aspect identification: Analyzing role of different classifiers

  • Author

    Xing Hu ; Manna, Sukanya ; Truong, Brian N.

  • Author_Institution
    Comput. Sci. Dept., California State Polytech. Univ., Pomona, CA, USA
  • fYear
    2014
  • fDate
    9-12 Dec. 2014
  • Firstpage
    202
  • Lastpage
    209
  • Abstract
    With the rapid advancement of eCommerce, it has become a common trend for customers to write reviews about any product they purchase. For certain popular products, such as cell phones, laptops, tablets, the number of reviews can be hundreds or even thousands, making it difficult for potential customers to identify specific aspect based overview of the product (for example, screen, camera, battery etc). This paper studies different classifiers for aspect identification from unlabeled free-form textual customer reviews. Firstly, a multi-aspect classification is proposed to learn implicit and explicit aspect-related context from the reviews for aspect identification, which does not require any manually labeled training data. Secondly, extensive experiments for analyzing the effectiveness of classifiers and feature selection for aspect identification have also been shown. The results of our experiments on smartphone reviews from Amazon show that Support Vector Machine´s accuracy in aspect identification is best, followed by Random Forest and Naive Bayes.
  • Keywords
    Bayes methods; electronic commerce; learning (artificial intelligence); pattern classification; purchasing; random processes; support vector machines; Amazon; Naive Bayes; aspect identification; classifiers; e-commerce; explicit aspect-related context; feature selection; implicit aspect-related context; multiaspect classification; product aspect identification; random forest; smartphone reviews; support vector machine accuracy; unlabeled free-form textual customer reviews; Batteries; Cameras; Machine learning algorithms; Support vector machines; Training; Training data; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence and Data Mining (CIDM), 2014 IEEE Symposium on
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/CIDM.2014.7008668
  • Filename
    7008668