• DocumentCode
    1797862
  • Title

    Classification with rejection based on various SVM techniques

  • Author

    Homenda, Wladyslaw ; Luckner, Marcin ; Pedrycz, Witold

  • Author_Institution
    Fac. of Math. & Inf. Sci., Warsaw Univ. Technol., Warsaw, Poland
  • fYear
    2014
  • fDate
    6-11 July 2014
  • Firstpage
    3480
  • Lastpage
    3487
  • Abstract
    The task of identifying native and foreign elements and rejecting foreign ones in the pattern recognition problem is discussed in this paper. Such the task is a nonstandard aspect of pattern recognition, which is rarely present in research. In this paper, ensembles of support vector machines solving two-classes and one-class problems are employed as classification tools and as basic tools for rejecting of foreign elements. Evaluation of quality of classification and rejection methods are proposed in the paper and finally some experiments are performed in order to illustrate acquainted terms and methods.
  • Keywords
    pattern classification; support vector machines; SVM technique; classification method; classification tools; foreign element identification; foreign element rejection; native element identification; pattern recognition problem; rejection method; support vector machines; Biomedical imaging; Kernel; Pattern recognition; Sensitivity; Standards; Support vector machines; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks (IJCNN), 2014 International Joint Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-6627-1
  • Type

    conf

  • DOI
    10.1109/IJCNN.2014.6889655
  • Filename
    6889655