DocumentCode
1800183
Title
Logistic regression of working memory impairments in children based on single-trial ERP features
Author
Tumari, Siti Zubaidah Mohd ; Sudirman, Rubita
Author_Institution
Dept. of Electron. & Comput. Eng., Univ. Teknol. Malaysia, Skudai, Malaysia
fYear
2014
fDate
19-21 Aug. 2014
Firstpage
264
Lastpage
269
Abstract
The purpose of this study is to determine the performance of the working memory in processing visual stimuli based on the single-trial Event-Related Potential (ERP) signal. This signal was further analyzed using the logistic regression method to investigate children´s working memory ability. This study involved 54 children aged 10 to 12 years old who were given computer-based visual stimuli while their working memory activities were simultaneously recorded using the Neurofax 9200 EEG acquisition machine. Redundant noises and artifacts were removed using wavelet algorithm and ICA techniques. The EEG signals were segmented to obtain the average mean of single-trial ERP and necessary input for the logistic regression classifier. Results indicated that the resultant parameters as well as biological data were significant in predicting whether a child had working impairment or not. Moreover, the signal´s sensitivity value was more than the specificity value. In conclusion, our results indicated the working memory impairment in children tends to worsen with age.
Keywords
data analysis; electroencephalography; feature extraction; medical signal processing; paediatrics; regression analysis; signal classification; signal denoising; visual evoked potentials; wavelet transforms; ICA techniques; Neurofax 9200 EEG acquisition machine; age 10 yr to 12 yr; biological data; children´s working memory ability; computer-based visual stimuli; logistic regression classifier; redundant artifacts; redundant noises; signal analysis; signal segmentation; signal sensitivity value; single-trial ERP; single-trial ERP features; single-trial event-related potential signal; visual stimuli processing; wavelet algorithm; working memory impairments; Accuracy; Electroencephalography; Feature extraction; Logistics; Noise; Sensitivity; Standards; ICA; Logistic Regression; Single-trial ERPs; Wavelet Algorithm; Working Memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Technology, Informatics, Management, Engineering, and Environment (TIME-E), 2014 2nd International Conference on
Conference_Location
Bandung
Print_ISBN
978-1-4799-4806-2
Type
conf
DOI
10.1109/TIME-E.2014.7011629
Filename
7011629
Link To Document