• DocumentCode
    1804080
  • Title

    Modeling & design for variability and reliability

  • Author

    McConaghy, Trent ; Onodera, Hidetoshi

  • Author_Institution
    Solido Design
  • fYear
    2012
  • fDate
    9-12 Sept. 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This session explores modeling & design techniques for statistical variability and aging/reliability at the circuit level, and at the device level. It has five presentations/papers.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2012 IEEE
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4673-1555-5
  • Electronic_ISBN
    0886-5930
  • Type

    conf

  • DOI
    10.1109/CICC.2012.6330569
  • Filename
    6330569
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1804080