• DocumentCode
    1804193
  • Title

    Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables

  • Author

    Yu, Bo ; Li, Xin ; Yonemura, James ; Wu, Zhiyuan ; Goo, Jung-Suk ; Thuruthiyil, Ciby ; Icel, Ali

  • Author_Institution
    Compact Modeling & Characterization Group, GLOBALFOUNDRIES Inc., Sunnyvale, CA, USA
  • fYear
    2012
  • fDate
    9-12 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we investigate the geometry dependence for the local variation of low-frequency noise in MOSFETs via the sum of lognormal random variables. A compact model has been developed and applied to the measured data with excellent match, and therefore enables the coverage of low-frequency noise statistics in circuit design.
  • Keywords
    MOSFET; integrated circuit design; integrated circuit modelling; integrated circuit noise; MOSFET; circuit design; compact model; geometry dependence; local variation modeling; lognormal random variable; low-frequency noise statistics; Logic gates; Low-frequency noise; MOSFET circuits; MOSFETs; Monte Carlo methods; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2012 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4673-1555-5
  • Electronic_ISBN
    0886-5930
  • Type

    conf

  • DOI
    10.1109/CICC.2012.6330573
  • Filename
    6330573
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1804193