• DocumentCode
    1804738
  • Title

    Interferometer diagnostics of plasma current open switch injector

  • Author

    Borovkov, V.V. ; Volkov, E.P. ; Almazova, K.I. ; Kornilov, V.G. ; Kornilov, S.Y. ; Selemir, V.D. ; Chelpanov, V.I.

  • fYear
    2001
  • fDate
    17-22 June 2001
  • Firstpage
    424
  • Abstract
    Summary form only given, as follows. The dynamic characteristics of plasma, flying out from injector to vacuum chamber of a plasma current open switch, are studied experimentally. Investigations were made using Michelson interferometer on the wavelength of He-Ne-laser (633 nm). Fast photorecorder FPR, operating in the regime of slit sweep with time resolution of 0.1 /spl mu/s, was used for recording of interference pattern. Plasma diagnostics was performed with two orientations of FPR slit-along plasma flux direction and perpendicular to it. Experiments have showed that free plasma electrons plays the main role in the change of refraction index. Error in determination of electrons linear density did not exceed 15/spl times/10/sup 15/ cm/sup -2/. Interferometer measurements show that at optimum operating regime plasma injector allows to create electron linear density of about 4/spl times/10/sup 17/ cm/sup -2/ in interelectrode gap. This corresponds to average electrons concentrations in the plasma column of 1/spl times/10/sup 17/ cm/sup -3/.
  • Keywords
    light interferometry; plasma diagnostics; plasma switches; vacuum switches; 633 nm; He-Ne-laser; Michelson interferometer; electrons linear density; fast photorecorder FPR; interelectrode gap; interference pattern; interferometer diagnostics; plasma column; plasma current open switch injector; plasma diagnostics; plasma dynamic characteristics; plasma flux direction; refraction index; vacuum chamber; Conductors; Electrons; Explosions; Ignition; Plasma density; Plasma diagnostics; Plasma measurements; Plasma properties; Plasma waves; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts
  • Conference_Location
    Las Vegas, NV, USA
  • Print_ISBN
    0-7803-7141-0
  • Type

    conf

  • DOI
    10.1109/PPPS.2001.961170
  • Filename
    961170