• DocumentCode
    1805994
  • Title

    Position monolithic silicon detector telescope: simulation results

  • Author

    Bottiglieri, Gerardo ; Amorini, Francesca ; Cardella, Giuseppe ; Di Pietro, Alessia ; Fallica, P.G. ; Figuera, Pierpaolo ; Liotta, Salvatore Fabio ; Morea, Annarita ; Musumarra, Agatino ; Papa, Massirno ; Rizzo, Francesca ; Tudisco, Salvatore ; Valvo, Giu

  • Author_Institution
    ST Microelectron. s.r.l, Catania, Italy
  • Volume
    3
  • fYear
    2004
  • fDate
    18-20 May 2004
  • Firstpage
    1811
  • Abstract
    The collaboration between ST Microelectronics, INFN LNS and Catania University gave birth to the design of a monolithic silicon ΔE-E detector telescope in the last years. Using ion implantation techniques, the ΔE stage of that telescope was integrated on the same silicon E detector and an ultra thin ΔE stage (≈ 1 μm thick) with an excellent charge resolution for low energy (less than 5 MeV) ions was obtained. The positive experience, we got from that already developed silicon monolithic ΔE-E telescope, encouraged its to work on a new generation detector. Our aim is to develop a large area "multidetector" device able to give not only a good charge resolution for low energy ions but also position information. The feasibility of this kind of detector has been verified by 2D simulations carried out by DESSIS ISE(*) device simulator.
  • Keywords
    discrete event simulation; high energy physics instrumentation computing; position sensitive particle detectors; silicon radiation detectors; ΔE-E detector telescope; 2D simulations; DESSIS; Si; charge resolution; induction peak; ion implantation; large area multidetector; low energy ions; mixed mode simulations; pair generation; position monolithic silicon detector telescope; Charge measurement; Current measurement; Detectors; Electrons; Energy measurement; Extraterrestrial measurements; Laboratories; Microelectronics; Silicon; Telescopes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2004. IMTC 04. Proceedings of the 21st IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-8248-X
  • Type

    conf

  • DOI
    10.1109/IMTC.2004.1351435
  • Filename
    1351435