• DocumentCode
    1806546
  • Title

    Determining of Young’s modulus of multi-layered structure by SAWs method

  • Author

    Xiao, Xia ; You, Xue-Yi

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Tianjin Univ., Tianjin
  • Volume
    2
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    641
  • Lastpage
    644
  • Abstract
    The surface acoustic waves (SAWs) technique is becoming an attractive tool for accurately and nondestructively characterizing the mechanical property of thin film. The theoretical equations for describing SAWs propagating on the multi-layered structure are derived in this study. The dispersion features of SAWs propagating on the example TiO2/TiN duplex film coated on titanium alloy are investigated to instruct an accurate and facile fitting process for determining Young´s modulus of TiO2/TiN duplex film. The dependence of dispersion relation on the elastic modulus of TiO2 and TiN as well as frequency are provided and discussed in detail. The study shows an obvious influence of multi-layered structure on the dispersion relation of SAWs. Numerical result shows that the dispersion curve is well separated. It confirms that the SAWs technique has high resolution on determining Young´s modulus of multi- layered structure.
  • Keywords
    Young´s modulus; dispersion (wave); multilayers; surface acoustic waves; thin films; titanium compounds; TiO-TiN; Young´s modulus; dispersion features; duplex film; elastic modulus; facile fitting process; mechanical property; multilayered structure; surface acoustic waves technique; thin film; titanium alloy; Acoustic propagation; Acoustic waves; Dispersion; Equations; Mechanical factors; Sawing machines; Surface acoustic waves; Tin; Titanium alloys; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-1879-4
  • Electronic_ISBN
    978-1-4244-1880-0
  • Type

    conf

  • DOI
    10.1109/ICMMT.2008.4540476
  • Filename
    4540476