• DocumentCode
    1807037
  • Title

    Interconnection of autonomous error-tolerant cells

  • Author

    Valtonen, Tuomas ; Nurmi, Tero ; Isoaho, Jouni ; Tenhunen, Hannu

  • Author_Institution
    Turku Center for Comput. Sci., Finland
  • Volume
    4
  • fYear
    2002
  • fDate
    2002
  • Abstract
    In this paper we propose an interconnection scheme for the autonomous error-tolerant (AET) cell introduced in a paper by Valtonen et al. (2001). The objective here is to partition the system into identical, physically autonomous and highly configurable cells that can operate without outside control or synchronization. In billion transistor Network-on-Chip (NoC) circuits, an AET cell fabric could prove highly flexible and reliable, and allow for low replication costs, due to homogeneousity. However, many challenges persist before a useful system can be constructed: the need for (i) scalable long-distance communication-global bus wiring fits poorly into a homogeneous, symmetric fabric and limits scalability, (ii) flexible communication-cells in all directions, within a given range, should be accessible and (iii) self-synchronizing topologies, due to the absence of external synchronization; (iv) the interconnect scheme is to be implemented using near-future technology generations, and (v) the fabric should be efficient when constituting billions of cells.
  • Keywords
    ULSI; VLSI; cellular arrays; fault tolerance; integrated circuit interconnections; integrated circuit layout; integrated circuit reliability; network topology; NoC circuits; autonomous error-tolerant cells; flexible communication; highly configurable cells; interconnect partitioning; interconnection scheme; network-on-chip circuits; scalable interconnect geometry; scalable long-distance communication; self-synchronizing topologies; symmetric wiring patterns; Communication system control; Control systems; Costs; Fabrics; Flexible printed circuits; Integrated circuit interconnections; Network-on-a-chip; Scalability; Telecommunication network reliability; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on
  • Print_ISBN
    0-7803-7448-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2002.1010495
  • Filename
    1010495