Generator for Test Set Construction of SMGF in Reversible Circuit by Boolean Difference Method

Reversible logic synthesis has received considerable attention in the light of advances recently made in quantum computation. Implementation of a reversible circuit is envisaged by deploying several special types of quantum gates, such as k-CNOT. Although the classical stuck-at fault model is widely used for testing conventional CMOS circuits, new fault models, namely single missing-gate fault (SMGF), repeated-gate fault (RGF), partial missing-gate fault (PMGF), and multiple missing-gate faults (MMGF), are likely to be more suitable for modeling defects in quantum k-CNOT gates. This work proposes an algorithm for deriving the test set for the detection of all single missing gate faults in a reversible circuit implemented with k-CNOT gates. Instead of deriving test set directly for the detection of missing gate faults, a Boolean generator is developed by Boolean difference method to derive the test set and to detect all the single missing gate faults of a reversible circuit. Experimental results on some benchmark circuits are also reported.