• DocumentCode
    180894
  • Title

    A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System

  • Author

    Taewoo Han ; Inhyuk Choi ; Hyunggoy Oh ; Sungho Kang

  • Author_Institution
    Dept. of Electr. & Electron. Eng. Comput. Syst., Yonsei Univ., Seoul, South Korea
  • fYear
    2014
  • fDate
    16-19 Nov. 2014
  • Firstpage
    81
  • Lastpage
    86
  • Abstract
    This paper proposes a new parallel test access strategy for multiple identical cores in a network-on-chip (NoC). The proposed test strategy takes advantage of the regular design of NoC to reduce both test area overhead and test time. The proposed NoC reused test access mechanism (TAM) adopted a pipelining structure and a deterministic test data routing algorithm in order to reuse the full bandwidth of links in the NoC. Also, the architecture has complete scalability according to the number of cores and applications for 3D environment are also represented. Experimental results show that the proposed TAM can test multiple cores with the same test time as a single core and negligible hardware overhead.
  • Keywords
    integrated circuit testing; microprocessor chips; multiprocessing systems; network routing; network-on-chip; NoC-based multicore system; network-on-chip; parallel test access strategy; test access mechanism; test area overhead; test data routing algorithm; Hardware; Multicore processing; Pipeline processing; Routing; System-on-chip; Testing; Three-dimensional displays; NoC; TAM; multiple identical cores; parallel test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2014 IEEE 23rd Asian
  • Conference_Location
    Hangzhou
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2014.26
  • Filename
    6979081