• DocumentCode
    1809741
  • Title

    Why Transient Analysis Can Be De-Emphasized in Undergraduate Simulation Courses

  • Author

    Pham, H.T.L. ; Pittman, J.L. ; Court, M.C.

  • Author_Institution
    Sch. of Ind. Eng., Oklahoma Univ., Norman, OK
  • fYear
    2006
  • fDate
    3-6 Dec. 2006
  • Firstpage
    2270
  • Lastpage
    2276
  • Abstract
    We present the results of coverage tests performed to validate our preliminary analysis indicating that determining ´appropriate´ run length is more important for obtaining coverage than performing ´proper´ transient analysis. Our preliminary experiment was designed with the intention of showing students the pitfalls of performing ´bad´ transient analysis when estimating steady-state parameters. However, we found that for short run lengths any transient truncation diminishes coverage; and it is only beneficial to delete transient data when long runs of the output data are available. As with the preliminary analysis, two types of systems are analyzed (M/M/1/GD/infin/infin systems and an M/M/1/GD/infin/infin); additionally, coverage tests are also conducted on 3-stage M/M/1/GD/infin/infin queuing systems. The coverage analysis supports our preliminary conclusion: when first exposing students to the subject of output analysis on non-terminating systems, strong emphasis should be placed on choosing proper run length and the time devoted to transient analysis can be reduced
  • Keywords
    educational courses; queueing theory; transient analysis; coverage analysis; queuing systems; steady-state parameters; transient analysis; undergraduate simulation courses; Analytical models; Closed-form solution; Industrial engineering; Parameter estimation; Performance analysis; Performance evaluation; Queueing analysis; Steady-state; Testing; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2006. WSC 06. Proceedings of the Winter
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    1-4244-0500-9
  • Electronic_ISBN
    1-4244-0501-7
  • Type

    conf

  • DOI
    10.1109/WSC.2006.323052
  • Filename
    4117879