• DocumentCode
    1810283
  • Title

    Electric fields in the transition region of sphere-gaps to parallel-plane gaps

  • Author

    Punekar, G.S. ; Mishra, Vivek ; Kishore, N.K. ; Shastry, H.S.Y.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Inst. of Tech., Karnataka, India
  • fYear
    2004
  • fDate
    20-22 Dec. 2004
  • Firstpage
    460
  • Lastpage
    463
  • Abstract
    The electrode gaps which results in to uniform electric fields are the most widely used gap configurations in assessing dielectric strength. In the present study simulation results of parallel plane electrode gap configurations with symmetrical and unsymmetrical supply are reported. When plane radius of plane electrode is reduced the plane electrode at its extreme case forms a sphere resulting in to sphere gap arrangement. Results in this transition region are reported. The charge simulation method (CSM) is used to compute electric fields; with errors in simulation being less than 0.06% (in potential). Simulation results indicate that as the plane radius increases the field uniformity increases. Non uniformity for a given plane radius depends on the gap spacing. For given gap spacing when the plane radius of the electrode is more than the gap spacing, improvement in uniformity are not significant The unsymmetrical supply results in higher field non-uniformity in the gap. The height of high voltage (H.V.) electrode above the ground plane (designated as parameter "A" in IS 1876-1961 for sphere gaps with vertical electrode arrangement) has shown negligible influence on the electric field distribution in the gap.
  • Keywords
    earth electrodes; electric strength; high-voltage engineering; spark gaps; surface charging; CSM; charge simulation method; dielectric strength; electric field distribution; gap spacing; high voltage electrode height; parallel-plane electrode gap; sphere-gap; transition region; Computational geometry; Computational modeling; Dielectric breakdown; Electrodes; Finite difference methods; Insulation; Materials testing; Measurement standards; Solid modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    India Annual Conference, 2004. Proceedings of the IEEE INDICON 2004. First
  • Print_ISBN
    0-7803-8909-3
  • Type

    conf

  • DOI
    10.1109/INDICO.2004.1497795
  • Filename
    1497795