• DocumentCode
    1812501
  • Title

    An conducted electromagnetic interference (EMI) noise source modeling method using Hilbert transform

  • Author

    Qiu, X.H. ; Zhao, Y. ; Li, S.J. ; Jiang, N.Q. ; Wu, X.H.

  • Author_Institution
    Coll. of Commun. Eng., Nanjing Post & Telecommun. Univ., Nanjing
  • Volume
    3
  • fYear
    2008
  • fDate
    21-24 April 2008
  • Firstpage
    1438
  • Lastpage
    1441
  • Abstract
    In this paper an approach for power-line EMI (electromagnetic interference) noise source modeling is presented by using Hilbert transform,. First, the importance on EMI noise source modeling., i.e. the source impedance extraction is introduced as the fundamental of power-line EMI filter design for conducted EMI noise suppression. Next, the approach is described and analyzed where the insertion loss method is applied for source impedance amplitude extraction and Hilbert transform method is employed for impedance phase extraction. Simulation and experimental results show that this approach can be utilized effectively for conducted EMI noise source modeling.
  • Keywords
    Hilbert transforms; electric impedance; electromagnetic interference; EMI noise source modeling; Hilbert transform; conducted electromagnetic interference; electromagnetic interference noise suppression; impedance phase extraction; insertion loss method; power-line electromagnetic interference filter design; power-line electromagnetic interference noise source modeling; source impedance amplitude extraction; source impedance extraction; Circuit noise; Delta modulation; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic interference; Electromagnetic modeling; Filters; Impedance measurement; Noise generators; Noise measurement; Hilbert transform; conducted noise source modeling; electromagnetic compatibility (EMC); electromagnetic interference(EMI);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Millimeter Wave Technology, 2008. ICMMT 2008. International Conference on
  • Conference_Location
    Nanjing
  • Print_ISBN
    978-1-4244-1879-4
  • Electronic_ISBN
    978-1-4244-1880-0
  • Type

    conf

  • DOI
    10.1109/ICMMT.2008.4540715
  • Filename
    4540715