DocumentCode
181258
Title
Advanced cathode and anode injection control concept for 1200V SC(Schottky controlled injection)-diode
Author
Matsudai, Tomoko ; Ogura, Tsuneo ; Oshino, Yuuichi ; Kobayashi, Takehiko ; Misu, Shinichiro ; Ikeda, Yasuhiro ; Nakamura, Kentaro
Author_Institution
Discrete Semicond. Div., Toshiba Corp., Kawasaki, Japan
fYear
2014
fDate
15-19 June 2014
Firstpage
19
Lastpage
22
Abstract
At ISPSD2013, we presented an SC-diode that realizes low forward voltage drop (VF), low reverse recovery loss and low leakage current at high temperature of over 175 °C, with a combination of very low injection efficiency and high carrier lifetime. This paper proposes an advanced low injection cathode concept with N Schottky region enabling the SC-diode to obtain excellent fast recovery characteristics, realizing a range of 10 kH switching frequency. We discuss a balance of injection efficiency between two sides (anode and cathode), which is very important for reducing voltage ringing during reverse recovery under low current turn-on condition of IGBTs. Furthermore, we have obtained high reverse recovery ruggedness by controlling impact ionization position where is only bottom of deep P anode layer.
Keywords
Schottky diodes; anodes; cathodes; insulated gate bipolar transistors; ionisation; IGBT; ISPSD2013; Schottky controlled injection; Schottky diode; anode injection control; cathode injection control; forward voltage drop; impact ionization; leakage current; reverse recovery loss; voltage 1200 V; Anodes; Cathodes; Charge carrier lifetime; Charge carrier processes; P-i-n diodes; Schottky diodes; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
Conference_Location
Waikoloa, HI
ISSN
1943-653X
Print_ISBN
978-1-4799-2917-7
Type
conf
DOI
10.1109/ISPSD.2014.6855965
Filename
6855965
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