• DocumentCode
    181308
  • Title

    An improved on-resistance high voltage LDMOS with junction field plate

  • Author

    Jie Wei ; Xiaorong Luo ; Xianlong Shi ; Ruichao Tian ; Bo Zhang ; Zhaoji Li

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Device, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2014
  • fDate
    15-19 June 2014
  • Firstpage
    127
  • Lastpage
    130
  • Abstract
    An improved breakdown voltage LDMOS with reduced specific on-resistance is proposed and its mechanism is investigated. The LDMOS is characterized by a junction-type field plate (JFP) and an N+ floating layer (NFL) in the p-substrate. First, the linear doped JFP not only modulates the surface electric field (E-field) distribution of the drift region to make it more uniform and thus increases the breakdown voltage (BV), but also employs the P region in the JFP to deplete the N-drift region in the off-state, and hence increases the drift region doping (Nd) and decreases the specific on-resistance (Rs, on). Second, the NFL is equal-potential in the lateral direction in the off-state, and it thus optimizes the E-field distributions at the source side and drain side; furthermore, the NFL in the p-sub introduces an additional PN junction in the vertical, both of which further improve the BV. Compared with a conventional LDMOS, the JFP NFL LDMOS increases the BV by 63.6% and reduces the Rs, on by 47.2%.
  • Keywords
    MOSFET; electric breakdown; BV; JFP NFL LDMOS; N-drift region; N+ floating layer; P region; PN junction; drift region doping; improved breakdown voltage LDMOS; improved on-resistance high-voltage LDMOS; junction field plate; linear-doped JFP; reduced specific on-resistance; surface E-field distribution; surface electric field distribution; Breakdown voltage; Doping; Electric breakdown; Junctions; Niobium; Resistance; Substrates; BV; N+ floating layer (NFL); Rs, on; junction field plate (JFP); linear doped;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2014 IEEE 26th International Symposium on
  • Conference_Location
    Waikoloa, HI
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4799-2917-7
  • Type

    conf

  • DOI
    10.1109/ISPSD.2014.6855992
  • Filename
    6855992