• DocumentCode
    1814102
  • Title

    Crystal optimization for a CsI(Tl)-PIN photodiode γ-ray probe by Monte Carlo method

  • Author

    Chavanelle, Jérôme ; Pousse, Annie ; Parmentier, Michel ; Kastler, Bruno

  • Author_Institution
    Lab. Imagerie Ingenierie Sante, Univ. de Franche-Comte, Besancon, France
  • Volume
    2
  • fYear
    2003
  • fDate
    19-25 Oct. 2003
  • Firstpage
    708
  • Abstract
    Precise tumor localization with a gamma probe based on a CsI(Tl) crystal coupled to a photodiode needs to improve the energy resolution of the device. In indirect gamma detection, quality of energy resolution depends on quality of light collection. For this purpose, we developed a simulation based on the Monte Carlo method, which describes the path of visible photons produced in a scintillator crystal by a photoelectric gamma interaction at 140 keV. A set of simulations was performed in order to study the influence of crystal geometry (shape and dimensions) and side surface conditions on light collection. Amount of detected signal versus gamma photon interaction positions in the crystal was also studied. In conclusion, for a photodiode with 10 mm × 10 min sensitive area, the best compromise between amount of collected light and uniformity of response versus interaction position was obtained for a 5 mm × 5 mm parallelepipedic crystal having ground faces covered with white reflectors.
  • Keywords
    Monte Carlo methods; caesium compounds; gamma-ray detection; p-i-n photodiodes; patient diagnosis; CsI(Tl)-PIN photodiode γ-ray probe; Monte Carlo method; crystal geometry; crystal optimization; energy resolution; photodiode; photoelectric gamma interaction; scintillator crystal; side surface conditions; tumor localization; Energy resolution; Gamma ray detection; Gamma ray detectors; Geometry; Neoplasms; Optimization methods; Photodiodes; Photonic crystals; Probes; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2003 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8257-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2003.1351798
  • Filename
    1351798