• DocumentCode
    1814220
  • Title

    Performance evaluation of different SRAM topologies using 180, 90 and 45 nm technology

  • Author

    Shaik, Sadulla ; Jonnala, Prathiba

  • Author_Institution
    Sch. of Electron., Vignan Univ., Vadlamudi, India
  • fYear
    2013
  • fDate
    5-6 Dec. 2013
  • Firstpage
    15
  • Lastpage
    20
  • Abstract
    The design of various standard SRAM topologies with different technologies has been designed and tested for delay and power dissipation with respect to the different supply voltages. For this consideration, different topologies viz. 6T, 7T, 8T, 9T and 10T SRAM cells have taken. And these cells are designed using generic process development kit (gpdk) 45, 90 and 180 nm technologies. And all these are tested in cadence tool. The detailed analysis about these cells functionality and their characteristic behavior with the applied parameter of supply voltage is presented. The results of the delay, power dissipation with respect to the Vdd are plotted using MATLAB software. Also their layouts were designed and tabulated their areas.
  • Keywords
    SRAM chips; performance evaluation; transistors; MATLAB software; SRAM cells; SRAM topologies; cadence tool; generic process development kit; performance evaluation; power dissipation; supply voltage parameter; Delays; Layout; Power dissipation; SRAM cells; Topology; Transistors; SRAM design; low power; optimization; subthreshold SRAM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Renewable Energy and Sustainable Energy (ICRESE), 2013 International Conference on
  • Conference_Location
    Coimbatore
  • Type

    conf

  • DOI
    10.1109/ICRESE.2013.6927819
  • Filename
    6927819