DocumentCode
1817935
Title
Introduction to the special session on secure implementations
Author
Leveugle, R.
Author_Institution
TIMA Lab., Grenoble, France
fYear
2005
fDate
6-8 July 2005
Firstpage
115
Abstract
This paper briefly introduces online testing and its evolution towards very sub micron technologies. How secure circuit designers and online testing experts collaboration can help detect online the occurrence of natural faults that may be used as a basis to counter fault-based attacks taking into account the particular needs of secure application.
Keywords
cryptography; fault diagnosis; integrated circuit design; integrated circuit testing; fault-based attacks; natural faults; online testing; secure application; secure circuit; secure implementations; very sub micron technologies; Application software; Circuit faults; Computer hacking; Electrical fault detection; Fault detection; Power system security; Protection; Space technology; Special issues and sections; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN
0-7695-2406-0
Type
conf
DOI
10.1109/IOLTS.2005.40
Filename
1498141
Link To Document