DocumentCode
1818545
Title
Image Segmentation of Overlapping Particles in Automatic Size Analysis Using Multi-Flash Imaging
Author
Koh, Tze Ki ; Miles, Nicholas ; Morgan, Steve ; Hayes-Gill, Barrie
Author_Institution
Sch. of Chem., Environ. & Min. Eng., Nottingham Univ.
fYear
2007
fDate
Feb. 2007
Firstpage
47
Lastpage
47
Abstract
In this paper, we propose a novel hardware approach to image segmentation, specifically in the case of overlapping particles. Our research is based on multi-flash imaging (MFI), originally developed to detect depth discontinuities. Multiple images captured with different illumination conditions provide additional information about a scene compared to conventional segmentation techniques. Shadows are used to identify true object edges and underlying particles. We applied the new approach in automated particle size analysis and evaluated it against the watershed and canny edge detection techniques. Evaluation results confirm that MFI can be applied in image segmentation and reveals the superiority of the approach against conventional techniques in the case of overlapping particles
Keywords
edge detection; image segmentation; automatic size analysis; canny edge detection; illumination; image segmentation; multiflash imaging; object edge identification; overlapping particles; shadows; watershed edge detection; Application software; Chemical analysis; Computer vision; Image analysis; Image edge detection; Image processing; Image segmentation; Layout; Lighting; Mining industry;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Computer Vision, 2007. WACV '07. IEEE Workshop on
Conference_Location
Austin, TX
ISSN
1550-5790
Print_ISBN
0-7695-2794-9
Electronic_ISBN
1550-5790
Type
conf
DOI
10.1109/WACV.2007.37
Filename
4118776
Link To Document