DocumentCode
1818831
Title
Evaluation of SET and SEU effects at multiple abstraction levels
Author
Anghel, L. ; Leveugle, R. ; Vanhauwaert, P.
Author_Institution
TIMA Lab., Grenoble, France
fYear
2005
fDate
6-8 July 2005
Firstpage
309
Lastpage
312
Abstract
This paper reviews the main approaches used to evaluate the effect of single event transients and single event upsets in digital circuits described at different abstraction levels. The two fault models are first discussed with respect to the circuit description levels, then complementary dependability evaluation methods are summarized.
Keywords
fault diagnosis; integrated circuit testing; performance evaluation; radiation effects; SET effects; SEU effects; complementary dependability evaluation; digital circuits; fault models; multiple abstraction levels; Analytical models; Circuit faults; Combinational circuits; Error analysis; Hardware; Integrated circuit modeling; Random access memory; Read-write memory; Single event upset; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
Print_ISBN
0-7695-2406-0
Type
conf
DOI
10.1109/IOLTS.2005.28
Filename
1498179
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